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AirSEM announces the full prototype of the patented electron microscopy column, enabling unprecedented observation and chemical analysis of specimens in the open air.

Sub-10nm Resolution Achieved! Breakthrough technology achieves an astonishing resolution of <10 nanometers in the open air while also enabling the EDX measurement of elements as light as beryllium.

This continued support will enable further development of AirSEM’s technology and help bring it to market.

AirSEM is the first to eliminate electrostatic charge during mask inspection in open air, ensuring accurate and efficient quality control in semiconductor manufacturing.