Updates

Updates

  • 07.09
    2023

    AirSEM Makes History

    AirSEM announces the full prototype of the patented electron microscopy column, enabling unprecedented observation and chemical analysis of specimens in the open air.

  • 01.08
    2024

    AirSEM Sets New Standards

    Sub-10nm Resolution Achieved! Breakthrough technology achieves an astonishing resolution of <10 nanometers in the open air while also enabling the EDX measurement of elements as light as beryllium.

  • 09.08
    2024

    AirSEM Secures Second Year Investment from Israel Innovation Authority!

    This continued support will enable further development of AirSEM’s technology and help bring it to market.

  • 11.09
    2024

    Breakthrough in Mask Inspection

    AirSEM is the first to eliminate electrostatic charge during mask inspection in open air, ensuring accurate and efficient quality control in semiconductor manufacturing.