Updates
Updates
- 07.09
2023AirSEM Makes History
AirSEM announces the full prototype of the patented electron microscopy column, enabling unprecedented observation and chemical analysis of specimens in the open air.
- 01.08
2024AirSEM Sets New Standards
Sub-10nm Resolution Achieved! Breakthrough technology achieves an astonishing resolution of <10 nanometers in the open air while also enabling the EDX measurement of elements as light as beryllium.
- 09.08
2024AirSEM Secures Second Year Investment from Israel Innovation Authority!
This continued support will enable further development of AirSEM’s technology and help bring it to market.
- 11.09
2024Breakthrough in Mask Inspection
AirSEM is the first to eliminate electrostatic charge during mask inspection in open air, ensuring accurate and efficient quality control in semiconductor manufacturing.