AirSEM Column OEM Integration

Elevate your optical inspection capabilities with AirSEM’s pioneering open-air SEM column seamlessly integrated into your existing setup to achieve higher resolution in large-scale applications, including large panels, PCBs, and more.

Sub-10nm resolution imaging:

Unparalleled detail for precise analysis.

Real-time Accurate chemical analysis:

Understand material composition with confidence.

Real-time monitoring:

Optimize production processes without interruption.

COMING SOON

AirSEM Open-Air Imaging Station

Revolutionize your high-throughput examination with AirSEM Open-Air Imaging Station. This groundbreaking system combines high-sensitivity detectors, including a backscattered electron detector for compositional and topographical analysis, a secondary detector, and STEM and EDX capabilities.

Rapid Results:

Minimal sample preparation and a streamlined workflow enable faster time-to-data.

Versatile Imaging:

Ideal for vacuum incompatible samples like liquids and high-vapor pressure materials.

Take Defect Analysis

to the Next Level

Learn more about our product offerings

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