Semiconductor Quality Control Made Easy. Finally.

Welcome to process defect analysis
like you’ve never seen before.

Microscopic analysis is critical for quality control.
SEMs achieve the highest magnification on the market,
but the vacuum environment they require severely limits
their practical applications and operational
efficiency.

AirSEM pushes process defect
control forward by performing
imaging and material analysis
directly in air.

Imagine the power to analyze
components without disrupting
the manufacturing process.

Pick a Size – Any Size

Achieve the flexibility to analyze components and panels of any size,
without compromising on the quality of analysis.

Stop At Nothing

Maintain efficiency and precision in production lines with
in-situ, non-disruptive, seamless analysis.

Analyze Anything

Gain image and material analysis (EDX) capabilities in-air.

SEM Set Free

AirSEM’s small footprint and overall dimensions
make it ideal for integration into second-party tools.

Practical OEM Process
Integration for
Correlative Microscopy
(Optical + SEM)

Automated Quality
Control for
Production Lines

Existing
System
Capability
Expansion
Imaging + EDX

Embrace the future of
defect analysis.

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