Semiconductor Quality Control Made Easy. Finally.

Welcome to process defect analysis
like you’ve never seen before.

Microscopic analysis is critical for quality control.
SEMs achieve the highest magnification on the market,
but the vacuum environment they require severely limits
their practical applications and operational

AirSEM pushes process defect
control forward by performing
imaging and material analysis
directly in air.

Imagine the power to analyze
components without disrupting
the manufacturing process.

Embrace the future of
defect analysis.

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